Wafer Defect Classifier

Real-time semiconductor wafer defect detection using CNN with attention mechanisms

50%

Input Image

Drag & drop wafer image here or click to browse

Wafer image

Classification Results

Analyzing wafer defects...

-
Primary Defect
0%
Confidence
0ms
Inference Time
0
Defects Found

Grad-CAM Visualization

Attention heatmap showing critical regions for classification

95.8%
Model Accuracy
8.5ms
Avg. Inference
10K+
Images Processed
4
Defect Classes