Yield Analysis Tool

Defect Pareto, DOE Analysis, 5 Whys Root Cause & FMEA Risk Assessment

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Current Yield (%)
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Predicted Yield (%)
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Top Defect Type
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RPN Score
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Cpk

Parameters

Y = Y₀ × (1 - D₀ × A)^n | Cpk = min[(USL-μ)/(3σ), (μ-LSL)/(3σ)]
RPN = Severity × Occurrence × Detection

3D Visualization

Defect Pareto Chart
DOE Main Effects Plot
Interaction Plot (2-way)
5 Whys Root Cause Tree
FMEA Risk Priority Matrix
Yield Prediction Curve
Cpk Distribution