PCM Research Database

1,247
Total Datasets
342
Device Configurations
89
Material Compositions
15.2 TB
Raw Data
All Results
GST-225
GST-326
Doped GST
Crystallization
Retention
Endurance
I-V Curves
Thermal

GST-225 Crystallization Kinetics @ 450-550K

Dec 15, 2024 | PCM Research Team | 1,234 downloads
Validated

Comprehensive JMAK crystallization study of Ge₂Sb₂Te₅ thin films (50nm) across multiple temperature ranges. Includes isothermal and non-isothermal measurements with extracted activation energies and Avrami exponents.

Ea
1.82 eV
n (Avrami)
2.8
Data Points
5,420
0.997

Threshold Switching in 22nm PCM Devices

Dec 10, 2024 | Device Physics Lab | 892 downloads
Validated

I-V characteristics and threshold switching behavior in scaled PCM devices. Dataset includes DC and pulsed measurements, statistical variations across 1000+ devices, and temperature dependence from 77K to 400K.

Vth
2.8±0.2 V
Ihold
12 μA
Ron/Roff
1000×
Devices
1,024

10-Year Retention Study: Doped GST Materials

Dec 5, 2024 | Reliability Team | 567 downloads
Validated

Long-term retention measurements and accelerated testing results for N-doped and C-doped GST. Includes Arrhenius extrapolation to 10 years at 85°C, drift coefficients, and failure analysis.

10yr @ 85°C
PASS
Ea (retention)
2.3 eV
Drift Coeff.
0.08
Test Hours
50,000

Thermal Crosstalk in 1Mb PCM Arrays

Nov 28, 2024 | Array Design Team | 234 downloads
New

3D thermal simulations and experimental validation of thermal crosstalk in high-density PCM arrays. Includes temperature mapping, disturb analysis, and optimization strategies for different cell spacings.

Array Size
1024×1024
Cell Pitch
4F²
Max ΔT
45 K
Simulations
500