Simulate spectral interference patterns for multi-layer thin films
Spectral oscillations arise from constructive/destructive interference between reflections at the top and bottom surfaces. Fringe period is inversely proportional to film thickness.
The spacing between adjacent maxima (Δλ) is related to film thickness: d ≈ λ₁λ₂ / [2n(λ₂ - λ₁)] where n is the film refractive index. This relationship enables rapid thickness estimation from spectral measurements.