SPECTRA-Lab

Semiconductor Process Equipment Characterization, Testing & Research Analysis Laboratory

Independent project, in active development. A semiconductor characterization and manufacturing execution platform combining a Python/FastAPI backend with a Next.js 14 frontend, PostgreSQL persistence, and a Celery + Redis async layer. Covers metrology (electrical, optical, structural, chemical), process control (CVD, PVD, CMP, Diffusion, Oxidation, Ion Implant, RTP), SPC with Western Electric rules, ML and virtual metrology, and a LIMS/ELN with role-based access. Core architecture in place from Sessions 1 to 17; currently in structural cleanup and finishing work.

7
Process Control Areas
4
Metrology Domains
17
Sessions Completed
In Build
Active Development

Quick Access

Source Repository

Browse the codebase, build plan, and per-session implementation notes. Clone and run locally with Docker via make smoke-test-build. See docs/BUILD_PLAN.md for the phased path from current state to production.

View on GitHub

Electrical Characterization

Comprehensive Electrical Analysis Suite

I-V Curve Analysis

Current-voltage characterization for diodes, transistors, and solar cells with automatic parameter extraction and curve fitting.

Interactive Demo

Hall Effect Measurement

Carrier concentration, mobility, and resistivity measurements using Van der Pauw and Hall bar configurations.

Interactive Demo

C-V Profiling

Capacitance-voltage profiling for doping concentration, interface trap density, and oxide thickness analysis.

Interactive Demo

Four-Point Probe

Sheet resistance and resistivity measurements with automatic correction factors for various sample geometries.

Interactive Demo

Optical Analysis

Advanced Spectroscopic Techniques

UV-Vis-NIR Spectroscopy

Transmission, reflection, and absorption measurements from 190nm to 3300nm for bandgap and optical property analysis.

Interactive Demo

FTIR Spectroscopy

Fourier Transform Infrared spectroscopy for chemical bond identification and thin film composition analysis.

Interactive Demo

Spectroscopic Ellipsometry

Thin film thickness and optical constants measurement with multi-layer modeling capabilities.

Interactive Demo

Photoluminescence

PL spectroscopy for bandgap determination, defect analysis, and quantum efficiency measurements.

Interactive Demo

Structural Analysis

Microscopy and Diffraction Techniques

X-Ray Diffraction

Crystal structure analysis, phase identification, and lattice parameter determination with Rietveld refinement.

Interactive Demo

SEM Analysis

Scanning electron microscopy for surface morphology, cross-section imaging, and EDS elemental mapping.

Interactive Demo

AFM Imaging

Atomic force microscopy for surface topography, roughness analysis, and nanoscale feature measurement.

Interactive Demo

TEM Analysis

Transmission electron microscopy for atomic-resolution imaging and electron diffraction analysis.

Interactive Demo

Chemical Analysis

Surface and Bulk Composition Analysis

XPS Analysis

X-ray photoelectron spectroscopy for surface chemical composition and oxidation state analysis.

SIMS Profiling

Secondary ion mass spectrometry for depth profiling and trace element detection at ppb levels.

XRF Analysis

X-ray fluorescence for rapid elemental analysis and thin film composition measurement.

Raman Spectroscopy

Molecular vibration analysis for stress measurement and material phase identification.

Process Control & MES

Seven process control areas, each with an engineering Process Control UI and a production MES dashboard

Area Process Type Coverage
CVD Chemical Vapor Deposition LPCVD, PECVD, MOCVD, AACVD process modes
PVD Physical Vapor Deposition Sputter, evaporation, pulsed laser deposition
CMP Chemical-Mechanical Polishing Polishing parameter control and endpoint coverage
Diffusion Thermal Diffusion B, P, As, Sb dopants; drive-in and pre-deposition
Oxidation Thermal Oxidation Dry/wet oxidation, temperature profiling, thickness control
Ion Implantation Ion Implant Dose, energy, and channeling control
RTP Rapid Thermal Processing Annealing, silicidation, spike anneal profiles

Oxidation MES

Thermal oxidation control with Deal-Grove model predictions, temperature profiling, and real-time thickness monitoring.

Interactive Demo

CVD MES

Chemical vapor deposition with 4 process modes, gas flow control, and in-situ film thickness monitoring.

Interactive Demo

SPC Dashboard

Statistical Process Control with control charts, Western Electric rules, Cpk/Ppk analysis, and drift detection.

Interactive Demo

Virtual Metrology

ML-powered process prediction with SHAP/LIME explainability, anomaly detection, and time series forecasting.

Interactive Demo

Lab Information Management

LIMS & Electronic Lab Notebook

Sample Tracking

Complete chain of custody, barcode/QR tracking, and sample lifecycle management.

Electronic Lab Notebook

E-signatures, version control, and 21 CFR Part 11 compliant documentation.

Data Export

Export to CSV, Excel, JSON, and integration with analysis software.

Automated Reporting

Customizable report templates with charts, statistics, and compliance documentation.

System Architecture

Modern Full-Stack Implementation

Next.js 14 Frontend

React 18 with TypeScript, shadcn/ui components, and real-time WebSocket updates.

FastAPI Backend

Python 3.11+ REST API with async support, Celery task queue, and Redis broker.

PostgreSQL 15

Persistence layer with Alembic migrations and SQLAlchemy models in the shared services package.

Docker & Kubernetes

Local stack via Docker Compose and a Kustomize base + production overlay for Kubernetes (Helm chart in Phase 9).

Technology Stack

Next.js 14 React 18 TypeScript FastAPI Python 3.11+ PostgreSQL 15 Redis Celery Docker Kubernetes WebSocket Grafana shadcn/ui SHAP/LIME